RWTH Aachen
University
Institute for Communication
Systems and Data Processing
Skip to content
Direkt zur Navigation
Home
Home

Publications – Details

Improving UMTS LTE Performance by UEP in High Order Modulation

Authors:
Helge Lüders, Andreas Minwegen, and Peter Vary
Book Title:
7th International Workshop on Multi-Carrier Systems & Solutions (MC-SS 2009)
Venue:
Herrsching, Germany
Event Date:
0.-0.5.2009
Publisher:
Springer
Date:
May 2009
Pages:
185–194
ISBN:
978-9-04812-529-6
Language:
English

Abstract

In this contribution we investigate the performance of the UMTS Long Term Evolution (LTE) physical layer using turbo coding and 64QAM with Gray mapping. We show how the mapping of systematic and parity bits to the six different bit positions defining one complex 64QAM symbol influences the convergence of the turbo decoder and thereby the bit error rate (BER) performance as well as number of necessary decoding iterations. Exploiting the unequal error protection (UEP) property of Gray mapped 64QAM results in an SNR performance gain of approximately 2 dB for the non-iterative system and in addition leads to a significant reduction of the necessary decoding iterations when iterative decoding is performed.

Download of Publication

Copyright Notice

This material is presented to ensure timely dissemination of scholarly and technical work. Copyright and all rights therein are retained by authors or by other copyright holders. All persons copying this information are expected to adhere to the terms and constraints invoked by each author's copyright. In most cases, these works may not be reposted without the explicit permission of the copyright holder.

The following notice applies to all IEEE publications:
© IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

File

lueders09a.pdf 155 K